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SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT
2018/04/05 | SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT

SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT

SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT

Features

  •     Non-contact, non-destructive measurement for inline PV applications
  •     Every single wafer can be measured in production
  •     No wearing parts unlike 4PP
  •     Grain size independent resistivity measurement
 
  • Address : No.500, Bade Central Rd., Renwu Dist., Kaohsiung City 81457, Taiwan (R.O.C.)