SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT

Thickness is a primary control parameter of silicon PV wafers. By filtering out wafers with non-standard thickness and shape, waste from wafer/cell breaking can be reduced.

Thickness of PV wafers is measured for two reasons:

1.To insure specification. From the thickness measured in different points of the wafer, the following parameters can be calculated:

• Average thickness
• Total Thickness variation (TTV)
• Thickness Deviation

2.To obtain resistivity value by using the Eddy current technique based on thickness information to report the bulk resistivity of the sample.

DATA:SEMILAB