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SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT
2018/04/05 | SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT

SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT

SEMILAB WMT-1 SILICON PV WAFERS THICKNESS AND RESISTIVITY MEASUREMENT 10

Features

  •     Non-contact, non-destructive measurement for inline PV applications
  •     Every single wafer can be measured in production
  •     No wearing parts unlike 4PP
  •     Grain size independent resistivity measurement
  • 聯絡電話 : 07-3752385 (+886-7-3752386)
  • 傳真 : 07-3752387
  • 電子郵件：huang@yuyiplc.com
  • 聯絡地址 : 高雄市仁武區八德中路500號